Company Profile
Updated: 18-DEC-09International Controls and Measurements Corp.
Private Company, Headquarters Location
6333 Daedelus Dr., Cicero, NY 13039, United States
Primary SIC: Semiconductors And Related Devices, Primary NAICS: Semiconductor and Related Device Manufacturing
Description: Manufacturing: Semiconductors And Related Devices
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FORM 8-K: TRANSATLANTIC PETROLEUM ANNOUNCES ENTRY INTO MATERIAL DEFINITIVE AGREEMENT
US Fed News Service, Including US State News; 12/29/2009; 1484 words; ...Exploration Mediterranean International Pty. Ltd...Petroleum (USA) Corp. and TransAtlantic...Borrowers. During a measurement period of the four...occurrence of a change of control is an event of default. A change of control is defined as the...and operational control of the ...
Publication No. WO/2009/154211 Published on Dec. 23, Assigned to Hitachi High-Technologies for Automatic Analyzer (Japanese Inventors)
US Fed News Service, Including US State News; 12/24/2009; 467 words; ...Hitachi High-Technologies Corp., Tokyo. According to an...that is capable of continuous measurement while keeping constant the...equipped with an algorithm that controls operation for the purpose...The invention carries International Patent Publication No. WO...
Publication No. WO/2009/149104 Published on Dec. 10, Assigned to Rosum for Time, Frequency, Location Determination (American Inventors)
US Fed News Service, Including US State News; 12/14/2009; 448 words; ...assigned to Rosum Corp., Mountain View...media comprise: a measurement module adapted to generate measurements of a wireless...apparatus and measurements of a wireless...apparatus based on the measurements of the wireless...provide a clock control signal for the...invention carries ...
Publication No. WO/2009/147720 Published on Dec. 10, Assigned to Advantest for Semiconductor Wafer, Semiconductor Circuit, Testing Board, Testing System (Japanese Inventors)
US Fed News Service, Including US State News; 12/11/2009; 525 words; ...assigned to Advantest Corp., Tokyo. According...a plurality of measurement points on the semiconductor...the corresponding measurement points, respectively...the corresponding measurement point and the external...section; and a control section for controlling...invention carries ...
Patent No. 7,617,988 Issued on Nov. 17, Assigned to International Controls and Measurement for Intrusion Barrier (New York Inventors)
US Fed News Service, Including US State News; 11/18/2009; 453 words; ...inventors were issued U.S. Patent No. 7,617,988 on Nov. 17. The patent has been assigned to International Controls and Measurement Corp., North Syracuse, N.Y. According to the abstract released by the U.S. Patent & Trademark...
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