AFM (USA) Inc.

Research in the area of materials science reported from T. Mueller and colleagues.
Nanotechnology Weekly; 11/9/2009; 627 words; ...atomic force microscopy (AFM) probes, and thus enables...8482; techniques. The AFM image can be used to target...marries the resolution of AFM to the unambiguous and...Mueller, Veeco Instruments Inc., 112 Robin Hill Rd., Santa Barbara, CA 93117, USA. Publisher contact information...

New ceramics findings from J.F. Fernandez and co-authors described.
Journal of Technology; 11/3/2009; 798 words; ...effects: the antiferromagnetic (AFM) response with T-N = 25 K...proposed unusual coupling of the AFM Cu2+ superexchange interaction...Wiley-Blackwell Publishing, Inc., Commerce Place, 350 Main St., Malden 02148, MA, USA. Keywords: Emerging Technologies...

Findings from University of Louvain in nanotechnology reported.(Report)
Nanotechnology Weekly; 10/12/2009; 735 words; ...for Measuring Si-Fin Sidewall Roughness by AFM. IEEE Transactions on Nanotechnology, 2009...Institute Electrical Electronics Engineers Inc., 445 Hoes Lane, Piscataway, NJ 08855, USA. Keywords: Emerging Technologies, Nanoelectromechanical...

Research on chemical research published by M.Q. He et al.
Chemicals & Chemistry; 10/2/2009; 625 words; ...stability. X-ray diffraction and AFM studies suggest that the polymer...contact M.Q. He, Corning Inc., SP-FR-6, Corning, NY 14830, USA. Publisher contact information...NW, Washington, DC 20036, USA. Keywords: United States...

Investigators at Kyung-Hee University have published new data on science.
Electronics Newsweekly; 9/30/2009; 755 words; ...TIPS thin films by atomic force microscopy (AFM) and X-ray diffraction spectroscopy showed...Institute Electrical Electronics Engineers Inc., 445 Hoes Lane, Piscataway, NJ 08855, USA. Keywords: South Korea, Electronics, Voltage...