Company Profile
Updated: 17-SEP-09Jeol Ltd.
International public company
1-2, Musashino 3-chome Akishima, Tokyo, 196-8558, Japan
(81)425431111, (81)425463353 fax, http://www.jeol.co.jp
Primary SIC: Laboratory Analytical Instruments, Primary NAICS: Analytical Laboratory Instrument Manufacturing
Description: Manufacturing: Scientific and medical equipment, electron microscopes, analytical equipment, and blood analyzers.
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MICROSCIENCE 2010 Exhibition to be as big as ever.
Science Letter; 11/17/2009; 895 words; ...calendar." With all the major companies, such as Hitachi, JEOL, FEI, Leica, Olympus and Carl Zeiss, exhibiting alongside...Huw Thomas, Northern European Manager at Leica Microsystems UK Ltd and Vice-Chair of the Society's Trade Advisory Committee...
Contract Awards: Jeol Wins 143,551 GBP Contract for Microscopes
US Fed News Service, Including US State News; 11/12/2009; 320 words; SWINDON, United Kingdom, Nov. 12 -- Jeol (UK) Ltd., Welwyn Garden City, United Kingdom, won a 143,551 GBP (excluding VAT) contract award from RCUK Shared Service Centre...
Contract Awards: Jeol Wins Contract for Transmission Electron Microscope
US Fed News Service, Including US State News; 10/31/2009; 300 words; NEWCASTLE UPON TYNE, United Kingdom, Oct. 31 -- Jeol UK Ltd., Herts, United Kingdom, won a contract award from The Newcastle Upon Tyne Hospitals NHS Foundation Trust for transmission...
Patent No. 7,605,378 Issued on Oct. 20, Assigned to JEOL for Charged-Particle Beam System (Japanese Inventors)
US Fed News Service, Including US State News; 10/24/2009; 468 words; ...beam system. The inventors were issued U.S. Patent No. 7,605,378 on Oct. 20. The patent has been assigned to JEOL Ltd., Tokyo. According to the abstract released by the U.S. Patent & Trademark Office: "There is disclosed a...
Patent No. 7,598,496 Issued on Oct. 6, Assigned to Jeol for Charged Particle Beam System (Japanese Inventors)
US Fed News Service, Including US State News; 10/8/2009; 337 words; ...beam system. The inventors were issued U.S. Patent No. 7,598,496 on Oct. 6. The patent has been assigned to Jeol Ltd., Tokyo. According to the abstract released by the U.S. Patent & Trademark Office: "The present invention...
Recent News Articles
- Studies from JEOL, Ltd. provide new data on applied magnetic resonance research.
Electronics Newsweekly - October 29, 2008 - JEOL.(Surface Science)(Jeol Ltd. provides information regarding its scanning electric microscope )(Brief article)
Instrument Business Outlook - March 31, 2006 - Varian, Inc. Signs Cryogenically Cooled Probe Agreement With JEOL Ltd.
PR Newswire - February 23, 2005 - JEOL.(Surface science: product introductions)(Jeol Ltd. launches transmission electron microscope)(Brief Article)
Instrument Business Outlook - January 31, 2005
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