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NIKON DEBUTS VAAS DETECTOR IMAGING FOR CONFOCAL MICROSCOPY.

Publication: Imaging Update
Publication Date: 01-JAN-09 		Format: Online
Delivery: Immediate Online Access

Article Excerpt
Nikon Instruments, Inc., Melville, N.Y. has launched VAAS Detection, a new, exclusive confocal imaging method for post acquisition recovery of data normally lost during the course of the experiment. This is accomplished by collecting emission photons that normally are rejected by the emission side pinhole, traditionally used at the 1 airy disk size. This unique technology allows for virtual adjusting of the confocality and sensitivity of data post-acquisition, as well as collecting more photons during the initial image acquisition to enable image...

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