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AWARDS: ADE WaferSight Top Product of 2003.

Publication: NDT Update
Publication Date: 01-JAN-04
Format: Online - approximately 369 words
Delivery: Immediate Online Access

Article Excerpt
ADE Corp. announced the selection of WaferSight optical flatness metrology tool as one of the Top Ten Products of 2003 by Solid State Technology, in the December 2003 issue. Solid State Technology is a technical magazine published by PennWell Corp., of Tulsa, Oklahoma. The ranking, the magazine said, is for the highest-rated semiconductor/thin-film processing...

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