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Characterizing noise in voltage-reference ICs.

Publication: Test & Measurement World
Publication Date: 01-OCT-09
Format: Online
Delivery: Immediate Online Access

Article Excerpt
Jim Williams, EDN consulting editor and Linear Technology staff scientist

Voltage-reference stability and noise frequently define the measurement limits of instrumentation systems. In particular, reference noise often sets stable resolution limits.

Reference voltages have decreased with the continuing drop in system power-supply voltages, making reference noise increasingly important. The...

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