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Publication: Test & Measurement World
Publication Date: 01-JUL-09
Format: Online
Delivery: Immediate Online Access

Article Excerpt
Staff

Sampling of products from the past year

System tests 256 DDR3 devices in parallel

Staff

An expanded configuration of the Advantest T5503 high-speed memory test system offers parallel test capability of up to 256 DDR3 devices--double that of the previous T5503 model. The expanded configuration, known as the T5503 8448 Channel Test Head, works with Advantest's M6242 handler to form a complete DDR3 test cell. An optional pin card is available that preserves the 256-DUT (device under test) parallel test capacity for high-speed, high-pin-count stacked DRAM. The system can test DDR3-SDRAM, GDDR3, GDDR4, and other memory devices, with test speeds to 3.2 Gbps. Advantest , www.advantest.com...

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