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JTAG Technologies debuts boundary-scan I/O module.

Publication: Test & Measurement World
Publication Date: 01-DEC-08
Format: Online
Delivery: Immediate Online Access

Article Excerpt
Staff

The compact JT 2149/MPV DIOS (digital I/O scan) module provides test access to printed-circuit boards requiring external I/O stimulus and response monitoring.

The MPV (multi-programmable/multi-voltage) DIOS plugs directly into JTAG Technologies' QuadPOD, the standard front-end of the Data-Blaster series of boundary-scan JTAG controllers. When connected to a circuit...

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